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Transmission electron energy loss spectrometry in materials science
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ISBN: 0873391802 Year: 1992 Publisher: Warrendale The minerals, metals and materials society

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Electron energy loss spectrometers : the technology of high performance
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ISBN: 3540528180 3662138603 354047157X 9783540528180 Year: 1991 Volume: 63 Publisher: Berlin Heidelber New York, NY : Springer,

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Electron energy loss spectroscopy and surface vibrations
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ISBN: 0123693500 Year: 1982 Publisher: New York, NY : Academic Press,

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Electron energy-loss spectroscopy in the electron microscope
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ISBN: 0306452235 147575101X 1475750994 9780306452239 Year: 1996 Publisher: New York : Plenum Press,

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Electron energy loss spectroscopy
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ISBN: 1859961347 Year: 2001 Publisher: Oxford BIOS

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Electron energy-loss spectroscopy : in the electron microscope
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ISBN: 0306421585 1461568897 1461568870 Year: 1986 Publisher: New York, NY : Plenum Press,


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Unoccupied electronic states : Fundamentals for XANES, EELS, IPS and BIS
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ISBN: 3540541624 0387541624 3540474730 9783540541622 9780387541624 Year: 1992 Volume: 69 Publisher: Berlin Heidelberg New York, NY : Springer,


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Electron beam interactions with solids for microscopy, microanalysis & microlithography : proceedings of the 1st Pfefferkorn Conference, held April 18 to 23, 1982, at the Asilomar Conference Center, Monterey, CA
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ISBN: 0931288304 Year: 1984 Publisher: AMF O'Hare [Chicago], IL : Scanning Electron Microscopy, Inc.,


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A practical guide to transmission electron microscopy. : Advanced microscopy
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ISBN: 1606509187 9781606509180 9781606509173 Year: 2016 Publisher: New York, [New York] (222 East 46th Street, New York, NY 10017) : Momentum Press,

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Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.


Book
A practical guide to transmission electron microscopy
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ISBN: 1606507044 9781606507032 1606507036 9781606507049 Year: 2016 Publisher: New York [New York] (222 East 46th Street, New York, NY 10017)

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Abstract

Transmission electron microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope, the imaging resolution is at several hundred nanometers, and for a scanning electron microscope, SEM, at several nanometers. The imaging resolution of the TEM, however, can routinely reach several angstroms on a modem instrument. In addition, the TEM can also provide material structural information, since the electrons penetrate through the thin specimens, and chemical compositional information due to the strong electron-specimen atom interactions. Nowadays, TEM is widely applied in diverse areas in both physical sciences (chemistry, engineering, geosciences, materials science, and physics) and life sciences (agriculture, biology, and medicine), playing a key role in research or development for material design, synthesis, processing, or performance. This book provides a concise practical guide to the TEM user, starting from the beginner level, including upper-division undergraduates, graduates, researchers, and engineers, on how to learn TEM efficiently in a short period of time. It is written primarily for materials science and engineering or related disciplines, while some applications in life sciences are also included. It covers most of the areas using TEM, including the instrumentation, sample preparation, diffraction, imaging, analytical microscopy, and some newly developed advanced microscopy techniques. In each topic, a theoretical background is firstly briefly outlined, followed with step-by-step instructions in experimental operation or computation. Some technical tips are given in order to obtain the best results. The practical procedures to acquire, analyze, and interpret the TEM data are therefore provided. This book may serve as a textbook for a TEM course or workshop, or a reference book for the TEM user to improve their TEM skills.

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