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Book
Quantitative Data Processing in Scanning Probe Microscopy
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ISBN: 1283860465 1455730599 1455730580 0128133481 9781455730599 9781455730582 9780128133484 0128133473 9780128133477 Year: 2012 Publisher: Burlington Elsevier Science

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Abstract

Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous adv


Book
Quantitative Data Processing in Scanning Probe Microscopy : SPM Applications for Nanometrology
Author:
ISBN: 0128133473 Year: 2018 Publisher: San Diego : Elsevier Science,


Book
Instrumental community
Author:
ISBN: 9780262134941 9780262298186 026229818X 128332170X 9781283321709 0262134942 9786613321701 0262297248 9780262297240 6613321702 Year: 2011 Publisher: Cambridge, Mass. MIT Press

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In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.


Book
Scanning probe microscopy for energy research
Authors: ---
ISBN: 1299462588 981443471X 9789814434713 9789814434706 9814434701 9781299462588 Year: 2013 Publisher: [Hackensack] N.J. : World Scientific,

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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality h

Nanofabrication
Author:
ISBN: 1281933597 9786611933593 9812790896 9789812790897 9781613447789 1613447787 9781281933591 9789812700766 9812700765 9789812705426 9812705422 Year: 2008 Publisher: Singapore Hackensack, NJ World Scientific

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Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at building nanoscale structures, which can act as components, devices, or systems, in large quantities at potentially low cost. Nanofabrication is vital to all nanotechnology fields, especially for the realization of nanotechnology that involves the traditional areas across engineering and science. This is the first book solely dedicated to the manufacturing technology in nanoscale structures, devices, and systems and is designed to satisfy th

Roadmap of scanning probe microscopy
Author:
ISBN: 1280727225 9786610727223 3540343156 3540343148 3642070698 Year: 2007 Publisher: Berlin : Springer,

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Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Applied scanning probe methods VI : characterization
Authors: ---
ISBN: 3540373195 3540373187 3642072127 Year: 2007 Publisher: Heidelberg : Springer,

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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

Applied scanning probe methods VII : biomimetics and industrial applications
Authors: ---
ISBN: 3540373217 3540373209 3642072135 Year: 2007 Publisher: Berlin : Springer,

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Abstract

The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.


Book
Scanning probe microscopy in nanoscience and nanotechnology
Author:
ISBN: 3642035345 3642035906 9786612925610 3642035353 128292561X Year: 2010 Publisher: Berlin : Springer,

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Abstract

This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.


Book
Scanning probe microscopy : atomic scale engineering by forces and currents
Authors: ---
ISBN: 1280634510 9786610634514 1615833838 0387372318 Year: 2006 Publisher: New York : Springer Science+Business,

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Abstract

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.

Keywords

Scanning probe microscopy. --- Scanning electron microscopy. --- Electron microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Surfaces (Physics). --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Atomic/Molecular Structure and Spectra. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Physics --- Surface chemistry --- Surfaces (Technology) --- Molecular technology --- Nanoscale technology --- High technology --- Materials science. --- Materials—Surfaces. --- Thin films. --- Atomic structure  . --- Molecular structure . --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Physical sciences --- Qualitative --- Materials --- Surfaces. --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Surfaces --- Spectrometry --- Analytical chemistry

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