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Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous adv
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In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.
Nanotechnology --- Scanning probe microscopy. --- Intellectual cooperation --- Scientists --- Research --- Professional employees --- Cooperation, Intellectual --- Cultural exchange programs --- International cooperation --- International education --- Library cooperation --- Scanned probe microscopy --- Scanning electron microscopy --- Molecular technology --- Nanoscale technology --- High technology --- SCIENCE, TECHNOLOGY & SOCIETY/General --- Scanning probe microscopy
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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality h
Electric batteries --- Scanning probe microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Batteries, Electric --- Batteries (Electricity) --- Cell, Voltaic --- Electrical batteries --- Electrochemical cells --- Galvanic batteries --- Voltaic cell --- Electric power supplies to apparatus --- Electrochemistry --- Thermopiles --- Research. --- Industrial applications.
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Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at building nanoscale structures, which can act as components, devices, or systems, in large quantities at potentially low cost. Nanofabrication is vital to all nanotechnology fields, especially for the realization of nanotechnology that involves the traditional areas across engineering and science. This is the first book solely dedicated to the manufacturing technology in nanoscale structures, devices, and systems and is designed to satisfy th
Lithography, Electron beam. --- Nanostructured materials. --- Nanostructures. --- Scanning probe microscopy. --- Scanned probe microscopy --- Scanning electron microscopy --- Nanoscience --- Physics --- Electron beam lithography --- Electron beams --- Microelectronics --- Photolithography --- Nanomaterials --- Nanometer materials --- Nanophase materials --- Nanostructure controlled materials --- Nanostructure materials --- Ultra-fine microstructure materials --- Microstructure --- Nanotechnology --- Industrial applications
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Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
Scanning tunneling microscopy. --- Scanning probe microscopy. --- Materials science. --- Condensed matter. --- Engineering. --- Nanotechnology. --- Materials --- Thin films. --- Materials Science. --- Condensed Matter Physics. --- Engineering, general. --- Surfaces and Interfaces, Thin Films. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Molecular technology --- Nanoscale technology --- High technology --- Construction --- Industrial arts --- Technology --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Material science --- Physical sciences --- Surfaces. --- Surfaces --- Scanned probe microscopy --- Scanning electron microscopy --- STM (Microscopy) --- Scanning probe microscopy --- Surfaces (Physics). --- Physics --- Surface chemistry --- Materials—Surfaces.
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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Materials --- Scanning probe microscopy. --- Scanning probe microscopy --- Microscopy. --- Industrial applications. --- Engineering. --- Physical chemistry. --- Polymers. --- Solid state physics. --- Nanotechnology. --- Thin films. --- Nanotechnology and Microengineering. --- Surfaces and Interfaces, Thin Films. --- Polymer Sciences. --- Physical Chemistry. --- Solid State Physics. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Molecular technology --- Nanoscale technology --- High technology --- Physics --- Polymere --- Polymeride --- Polymers and polymerization --- Macromolecules --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Construction --- Industrial arts --- Technology --- Surfaces. --- Surfaces --- Scanned probe microscopy --- Scanning electron microscopy --- Microscopy --- Surfaces (Physics). --- Chemistry, Physical organic. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Surface chemistry --- Materials—Surfaces. --- Polymers .
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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.
Materials --- Scanning probe microscopy. --- Scanning probe microscopy --- Biomimetics. --- Microscopy. --- Industrial applications. --- Biomimicry --- Chemicals --- Scanned probe microscopy --- Scanning electron microscopy --- Microscopy --- Engineering. --- Nanotechnology. --- Surfaces (Physics). --- Polymers. --- Chemistry, Physical organic. --- Nanotechnology and Microengineering. --- Surfaces and Interfaces, Thin Films. --- Polymer Sciences. --- Physical Chemistry. --- Solid State Physics. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Polymere --- Polymeride --- Polymers and polymerization --- Macromolecules --- Physics --- Surface chemistry --- Surfaces (Technology) --- Molecular technology --- Nanoscale technology --- High technology --- Construction --- Industrial arts --- Technology --- Thin films. --- Polymers . --- Physical chemistry. --- Solid state physics. --- Surfaces. --- Materials—Surfaces. --- Solids --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Surfaces
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This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber.
Nanostructured materials -- Microscopy. --- Scanning probe microscopy. --- Scanning probe microscopy --- Nanostructured materials --- Materials Science --- Microscopy --- Technology - General --- Engineering & Applied Sciences --- Chemical & Materials Engineering --- Biology --- Health & Biological Sciences --- Microscopy. --- Nanomaterials --- Nanometer materials --- Nanophase materials --- Nanostructure controlled materials --- Nanostructure materials --- Ultra-fine microstructure materials --- Scanned probe microscopy --- Materials science. --- Condensed matter. --- Engineering. --- Nanotechnology. --- Materials Science. --- Condensed Matter Physics. --- Engineering, general. --- Microstructure --- Nanotechnology --- Scanning electron microscopy --- Construction --- Industrial arts --- Technology --- Molecular technology --- Nanoscale technology --- High technology --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids
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Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today’s simulation techniques and gives examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations used in today’s research, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the instrument's operation is changed by materials properties; theorists will understand how simulations can be directly compared to experimental data.
Scanning probe microscopy. --- Scanning electron microscopy. --- Electron microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Surfaces (Physics). --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Surfaces and Interfaces, Thin Films. --- Atomic/Molecular Structure and Spectra. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Physics --- Surface chemistry --- Surfaces (Technology) --- Molecular technology --- Nanoscale technology --- High technology --- Materials science. --- Materials—Surfaces. --- Thin films. --- Atomic structure . --- Molecular structure . --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Solids --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Films, Thin --- Solid film --- Solid state electronics --- Coatings --- Thick films --- Material science --- Physical sciences --- Qualitative --- Materials --- Surfaces. --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Surfaces --- Spectrometry --- Analytical chemistry
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