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Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.

Ellipsometry. --- Polarimetry --- Polarization (Light) --- Surfaces (Technology) --- Thin films --- Physical Sciences --- Engineering and Technology --- Optoelectronics --- Physics --- Optics and Lasers

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The book is devoted to the design, application and characterization of thin films and structures, with special emphasis on optical applications. It comprises ten papers—five featured and five regular—authored by scientists all over the world. Diverse materials are studied and their possible applications are demonstrated and discussed—transparent conductive coatings and structures from ZnO doped with Al and Ga and Ti-doped SnO2, polymers and nanosized zeolite thin films for optical sensing, TiO2 with linear and nonlinear optical properties, organic diamagnetic materials, broadband optical coatings, CrWN glass molding coatings, and silicon on insulator waveguides.

faraday rotation --- thin films --- magneto-optics --- organic material --- tolane derivatives --- optical coatings --- monitoring --- deposition --- titanium dioxide --- optical constants --- two-photon absorption --- nonlinear refraction --- scattering --- laser-induced deflection --- absorption measurement --- CrWN coatings --- microstructure evolution --- spinodal decomposition --- thermal stability --- hardness --- plasma enhanced magnetron sputtering --- sidewall roughness --- optical scattering loss --- silicon-on-insulator waveguide --- multilayer --- ZnO --- Ag --- TCO --- transmittance --- structure --- resistance --- SnO2 --- Ti-doped --- annealing temperature --- electrical resistivity --- optical sensors --- optical materials --- zeolites --- ellipsometry --- single wavelength ellipsometry --- spectroscopic ellipsometry --- poly(vinyl alcohol) copolymers --- humidity sensing --- Al-doped ZnO --- ALD technique --- transparent conductive layers --- LC display --- flexible PDLC devices --- transparent conductive coatings --- optical sensing --- broadband design --- linear and non-linear optical properties --- organic diamagnetic materials

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This handbook has been prepared as a working reference for the safety officer, the environmental engineer, and the consultant. For the safety officer, this handbook provides detailed guidelines and instructions in preparing Right-to-Know Reporting Audits, establishing programs and training employees on hazard awareness, and developing and implementing emergency response programs in the workplace and at off-site operations.For the environmental engineer, this handbook provides extensive technical data on toxic chemical properties and detailed instructional aid on how to properly

Ellipsometry --- Polarimetry --- Polarization (Light) --- Surfaces (Technology) --- Thin films --- Engineering --- Electronics --- Ellipsometry. --- Chemical spills --- Hazardous substances --- 614.75 --- Dangerous chemicals --- Dangerous goods --- Dangerous materials --- Dangerous substances --- Hazardous chemicals --- Hazardous goods --- Hazardous materials --- Hazmats --- Chemicals --- Materials --- Spills, Chemical --- Pollution --- Reporting&delete& --- Handbooks, manuals, etc --- Accidents&delete& --- Safety measures&delete& --- Accidents --- 614.75 Precautions with, and handling of, noxious and dangerous substances --- Precautions with, and handling of, noxious and dangerous substances --- General and Others --- Reporting --- Safety measures

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This book is composed of 6 papers. The first paper reports a novel technique for the selective emitter formation by controlling the surface morphology of Si wafers. Selective emitter (SE) technology has attracted renewed attention in the Si solar cell industry to achieve an improved conversion efficiency of passivated-emitter rear-contact (PERC) cells. In the second paper, the temperature dependence of the parameters was compared through the PERC of the industrial-scale solar cells. As a result of their analysis, PERC cells showed different temperature dependence for the fill factor loss as temperatures rose. The third paper reports the effects of carrier selective front contact layer and defect state of hydrogenated amorphous silicon passivation layer/n-type crystalline silicon interface. The results demonstrated the effects of band offset determined by band bending at the interface of the passivation layer and carrier selective front contact layer. In addition, the nc-SiOx: H CSFC layer not only reduces parasitic absorption loss but also has a tunneling effect and field-effect passivation. The fourth paper reports excimer laser annealing of hydrogenated amorphous silicon film for TOPCon solar cell application. This paper analyzes the crystallization of a-Si:H via excimer laser annealing (ELA) and compared this process with conventional thermal annealing. The fifth paper reports the contact mechanism between Ag–Al and Si and the change in contact resistance (Rc) by varying the firing profile. Rc was measured by varying the belt speed and peak temperature of the fast-firing furnace. The sixth paper reports a silicon tandem heterojunction solar cell based on a ZnO/Cu2O subcell and a c-Si bottom subcell using electro-optical numerical modeling. The buffer layer affinity and mobility together with a low conduction band offset for the heterojunction are discussed, as well as spectral properties of the device model.

fill factor loss analysis --- double-diode model --- PERC --- temperature dependence --- recombination current density --- parasitic resistance --- carrier selective contact --- rear emitter heterojunction --- passivation --- crystallinity --- thermal annealing --- excimer laser annealing --- amorphous hydrogenated silicon film --- metallization --- contact formation --- Ag/Al paste --- p+ emitter --- N-type bifacial solar cells --- silicon tandem heterojunction solar cell --- N-doped Cu2O absorber layer --- Al:ZnO (AZO) --- numerical electro-optical modeling --- scanning electron microscopy (SEM) --- atomic force microscopy (AFM) --- X-ray diffraction (XRD) --- spectroscopic ellipsometry (SE) --- Fourier-transform infrared (FTIR) spectroscopy --- degradation degree --- failure rate --- selective emitter --- surface morphology --- doping process --- solar cell

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Despite its limitation in terms of surface covered area, the PLD technique still gathers interest among researchers by offering endless possibilities for tuning thin film composition and enhancing their properties of interest due to: (i) the easiness of a stoichiometric transfer even for very complex target materials, (ii) high adherence of the deposited structures to the substrate, (iii) controlled degree of phase, crystallinity, and thickness of deposited coatings, (iv) versatility of the experimental set-up which allows for simultaneous ablation of multiple targets resulting in combinatorial maps or consecutive ablation of multiple targets producing multi-layered structures, and (v) adjustment of the number of laser pulses, resulting in either a spread of nanoparticles, islands of materials or a complete covering of a surface. Moreover, a variation of PLD, known as Matrix Assisted Pulsed Laser Evaporation, allows for deposition of organic materials, ranging from polymers to proteins and even living cells, otherwise difficult to transfer unaltered in the form of thin films by other techniques. Furthermore, the use of laser light as transfer agent ensures purity of films and pulse-to-pulse deposition allows for an unprecedented control of film thickness at the nm level. This Special Issue is a collection of state-of-the art research papers and reviews in which the topics of interest are devoted to thin film synthesis by PLD and MAPLE, for numerous research and industry field applications, such as bio-active coatings for medical implants and hard, protective coatings for cutting and drilling tools withstanding high friction and elevated temperatures, sensors, solar cells, lithography, magnetic devices, energy-storage and conversion devices, controlled drug delivery and in situ microstructuring for boosting of surface properties.

thin films --- matrix-assisted pulsed laser evaporation --- shellac --- enteric coatings --- PLD --- ITO --- nanoimprint lithography --- coatings --- nanostructure --- iron oxide --- pulsed laser deposition --- aluminum nitride --- nanoindentation testing --- TEM imaging --- FTIR spectroscopy --- ellipsometry --- complex refractive index --- composite coatings --- MAPLE --- Lactoferrin --- macrophage interactions --- animal-origin calcium phosphate coatings --- natural hydroxyapatite --- doping --- high adherence --- pulsed laser deposition technique --- biomimetic applications --- target preparation --- room temperature ferromagnetism --- dilute magnetic semiconductor --- Indium oxide --- (InFe)2O3 --- PLD films --- energy storage --- thin-film electrodes --- thin-film solid electrolyte --- lithium microbatteries --- calcium phosphate-based coatings --- synthetic and natural hydroxyapatite --- in vivo testing --- biomedical applications --- n/a