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Scanning probe microscopy. --- Scanned probe microscopy --- Scanning electron microscopy

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In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.

Nanotechnology --- Scanning probe microscopy. --- Intellectual cooperation --- Scientists --- Research --- Professional employees --- Cooperation, Intellectual --- Cultural exchange programs --- International cooperation --- International education --- Library cooperation --- Scanned probe microscopy --- Scanning electron microscopy --- Molecular technology --- Nanoscale technology --- High technology --- SCIENCE, TECHNOLOGY & SOCIETY/General --- Scanning probe microscopy

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Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization.

Nanotechnology. --- Scanning electron microscopy. --- Scanning probe microscopy --- Scanning electron microscopy --- Nanotechnology --- Chemical & Materials Engineering --- Biology --- Health & Biological Sciences --- Engineering & Applied Sciences --- Microscopy --- Materials Science --- Scanning probe microscopy. --- Scanned probe microscopy --- Materials science. --- Materials Science. --- Characterization and Evaluation of Materials. --- Electron microscopy --- Surfaces (Physics). --- Physics --- Surface chemistry --- Surfaces (Technology) --- Material science --- Physical sciences

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This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

Materials Science. --- Nanotechnology. --- Nanotechnology and Microengineering. --- Condensed Matter Physics. --- Engineering. --- Ingénierie --- Nanotechnologie --- Atomic force microscopy. --- Scanning probe microscopy. --- Scanning tunneling microscopy. --- Engineering & Applied Sciences --- Chemical & Materials Engineering --- Technology - General --- Materials Science --- STM (Microscopy) --- AFM (Microscopy) --- Scanned probe microscopy --- Materials science. --- Condensed matter. --- Scanning probe microscopy --- Scanning electron microscopy --- Construction --- Industrial arts --- Technology --- Molecular technology --- Nanoscale technology --- High technology --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids

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The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial applications. It became evident while editing Vols. I–IV that a large number of technical and applicational aspects are present and rapidly - veloping worldwide. Considering the success of Vols. I–IV and the fact that further colleagues from leading laboratories were ready to contribute their latest achie- ments, we decided to expand the series with articles touching ?elds not covered in the previous volumes. The response and support of our colleagues were excellent, making it possible to edit another three volumes of the series. In contrast to to- cal conference proceedings, the applied scanning probe methods intend to give an overview of recent developments as a compendium for both practical applications and recent basic research results, and novel technical developments with respect to instrumentation and probes. The present volumes cover three main areas: novel probes and techniques (Vol. V), charactarization (Vol. VI), and biomimetics and industrial applications (Vol. VII). Volume V includes an overview of probe and sensor technologies including integrated cantilever concepts, electrostatic microscanners, low-noise methods and improved dynamic force microscopy techniques, high-resonance dynamic force - croscopy and the torsional resonance method, modelling of tip cantilever systems, scanning probe methods, approaches for elasticity and adhesion measurements on the nanometer scale as well as optical applications of scanning probe techniques based on near?eld Raman spectroscopy and imaging.

Materials --- Scanning probe microscopy. --- Scanning probe microscopy --- Microscopy. --- Industrial applications. --- Engineering. --- Physical chemistry. --- Polymers. --- Solid state physics. --- Nanotechnology. --- Thin films. --- Nanotechnology and Microengineering. --- Surfaces and Interfaces, Thin Films. --- Polymer Sciences. --- Physical Chemistry. --- Solid State Physics. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Molecular technology --- Nanoscale technology --- High technology --- Physics --- Polymere --- Polymeride --- Polymers and polymerization --- Macromolecules --- Chemistry, Theoretical --- Physical chemistry --- Theoretical chemistry --- Chemistry --- Construction --- Industrial arts --- Technology --- Surfaces. --- Surfaces --- Scanned probe microscopy --- Scanning electron microscopy --- Microscopy --- Surfaces (Physics). --- Chemistry, Physical organic. --- Chemistry, Physical organic --- Chemistry, Organic --- Chemistry, Physical and theoretical --- Surface chemistry --- Materials—Surfaces. --- Polymers  .