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The early time charge carrier dynamics in quantum dot‐sensitized and organo‐metal halide perovskite solar cells are presented in this chapter. Using transient spectroscopy techniques, i.e., absorption, photoluminescence, and photoconductivity, we probed the generation mechanism, charge injection, mobility, and recombination of charges in the time scales of subpicosecond (ps) to a nanosecond. In few ps, electron injection from quantum dot to n‐type metal oxide (MO) is complete while hole injection to p‐type MO required hundreds of ps. The injection process is dictated by the band alignment, density of states of MO and the charge transfer state at the interface. For organo‐metal halide perovskite material, there is a distribution of exciton binding energy brought about by the nonuniformity in the quality of the sample. As a result, varying amount of exciton and highly mobile charges may be generated depending on the morphology of the film. In the sample presented here, we found that 30% of photo‐generated charges are excitons, which then dissociates within 2-3 ps. The rest of the photons are instantaneously converted into highly mobile charges (µe = 12.5 cm2 V-1 s-1 and µh = 7.5 cm2 V-1 s-1), and at the appropriate excitation fluence, the photoconductivity remains constant up to 1 ns. The time scale and mechanism of charge injection from perovskite into organic electrodes are also presented.
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A calibration procedure is generally an operation to determine a relationship between an output and an input of an instrument or an essential value of a measuring object in a measuring system. In other words, calibration is a comparison of a measuring device against a standard instrument of higher accuracy. In measuring fields, the calibration is clearly confirmed in the traceability system. The traceability is defined as the property of a result of a measurement whereby it can be related to strictly defined standards, in general, nationally or internationally recognized, through an unbroken c
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Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people
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The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. This review volume consists of reviewed papers prepared on the basis of the oral and poster presentations of the Conference participants. It covers all the general matters of advanced statistical modeling (e.g. uncertainty evaluation, experimental design, optimization, data analysis and applications, multiple me
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This volume collects refereed contributions based on the presentations made at the Sixth Workshop on Advanced Mathematical and Computational Tools in Metrology, held at the Istituto di Metrologia "G. Colonnetti" (IMGC), Torino, Italy, in September 2003. It provides a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources, and promotes collaboration in the context of EU programmes, EUROMET and EA projects, and MRA requirements. It contains articles by an important, worldwide group of metrologists and mat
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Measurement --- Metrology --- Physical measurements --- Mathematics
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In most field applications, broadband measurements are used where the spectral product of the source distribution and the meter's spectral responsivity is measured. This book discusses detector-based radiometric, photometric, color, radiation-temperature, digital imaging-system, and LED measurements. It also shows that, while in photometry, the meter's standard response covers only the visible, broadband measurements in the UV and IR require different standards. To avoid large errors when using a traditional detector- or source-standard, where the differences in the source distributions and in the meter's responsivities produce large errors, the signal measurement procedure itself must be standardized. To satisfy the steps of the procedure, selected or properly designed meters should be used. This book is a guide to performing uniform broadband measurements with low uncertainty.
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This volume collects the refereed contributions based on the presentations made at the Seventh Workshop on Advanced Mathematical and Computational Tools in Metrology, a forum for metrologists, mathematicians and software engineers that will encourage a more effective synthesis of skills, capabilities and resources. The volume contains articles by world renowned metrologists and mathematicians involved in measurement science and, together with the six previous volumes in this series, constitutes an authoritative source of the mathematical, statistical and software tools necessary in modern met
Measurement --- Physical measurements --- Metrology --- Computational tools
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