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Book
Gettering and defect engineering in semiconductor technology XIV
Authors: ---
ISBN: 9783038135159 3038135151 9783037852323 3037852321 Year: 2011 Publisher: Durnten-Zuerich Trans Tech

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The papers contained herein cover the most important and timely issues in the field of ""Gettering and Defect Engineering in Semiconductor Technology"", ranging from the theoretical analysis of defect problems to practical engineering solutions, with the emphasis on Si-based materials. Apart from the traditional topics of defect and materials engineering, characterization, modeling and simulation, and the co-integration of various material classes, topics such as materials for solar cells and photonics are discussed. Defects in graphene and in nanocrystals and nanowires are also treated, makin

Building valve amplifiers
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ISBN: 128096409X 9786610964093 0080470378 9780080470375 9781280964091 9780750656955 0750656956 Year: 2004 Publisher: Burlington, MA Newnes

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Building Valve Amplifiers is a unique hands-on guide for anyone working with tube audio equipment - as an electronics experimenter, audiophile or audio engineer. Particular attention has been paid to answering questions commonly asked by newcomers to the world of the vacuum tube, whether audio enthusiasts tackling their first build, or more experienced amplifier designers seeking to learn the ropes of working with valves. The practical side of this book is reinforced by numerous clear illustrations throughout.As well as the design and build of new valve amplifiers, complete with constr


Book
X-ray and related techniques : selected, peer reviewed papers of the International Conference on X-ray and Related Techniques in Research and Industry (IXCRI 2010) held at Langkawi Island, Malaysia from 9th to 10th of June 2010
Authors: ---
ISBN: 3038135666 9783038135661 3037850035 9783037850039 Year: 2011 Publisher: Stafa-Zurich, Switzerland : Trans Tech Publications,

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The 36 peer-reviewed papers cover mainly topics on X-ray and related research. Review from Book News Inc.: Selected and peer-reviewed from a June 2010 international conference on Langkawi Island, Malaysia, 36 papers survey how x-ray and similar imaging technologies are being used in research and industry. The topics include analyzing the mineralogical component of palm oil fuel ash with or without unburned carbon, the effect of different gloss firing temperature on the crystallization of zinc-based crystal glaze, forming a titanium carbide reinforced copper matrix composite by an process, syn


Book
Current material research ysing x-rays and related techniques II : selected, peer reviewed papers from the International Conference on X-Rays and Related Techniques in Research and Industry 2016 (ICXRI2016), August 17-18, 2016, Putrajaya, Malaysia
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ISBN: 3035730296 9783035730296 9783035710298 3035710295 Year: 2017 Publisher: Switzerland : Trans Tech Publications Ltd,

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Book
Valve amplifiers
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ISBN: 9780080966403 0080966403 9786613310934 1283310937 0080966411 9780080966410 Year: 2012 Publisher: Amsterdam ; Boston : Elsevier/Newnes,

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Reviews of previous editions: ""Jam-packed with theory, circuit analysis, and DIY basics, it will walk you through all stages of design so that you can create your own wonders. Jones is an ex-BBC engineer with a cool writing style and you'll find it a no-pain education"". Hi-Fi News and Record Review ""Valve Amplifiers is an extremely well written book, containing a wealth of information that all audio designers and builders will find useful"". Glass Audio Valve Amplifiers is a market leader for one simple reason: in this specialist area it is recognized as the most com


Book
Runaway electrons preionized diffuse discharges
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ISBN: 1633219402 9781633219403 9781633218833 163321883X Year: 2015 Publisher: New York : Nova Publishers,

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This collective book provides a review and summary of recent ten-year research in runaway electron preionized diffuse discharges (REP DD) formed in an inhomogeneous electric field in different gases at increased pressure. Attention is also given to volume (diffuse) discharges in a homogeneous electric field, barrier discharges, and so-called open low-pressure discharges. The book has contributions by research groups from different countries and institutes, which added much to the scope of data presented. New experimental techniques and equipment, including those with picosecond time resolution


Book
Advanced X-ray detector technologies : design and applications
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ISBN: 9783030642792 Year: 2022 Publisher: Cham, Switzerland : Springer,

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Book
X-ray Studies on Electrochemical Systems
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ISBN: 3110427966 3110427885 9783110427882 3110437503 9783110437508 Year: 2017 Publisher: Berlin/Boston, UNITED STATES De Gruyter

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This book is your graduate level entrance into battery, fuel cell and solar cell research at synchrotron x-ray sources. Materials scientists find numerous examples for the combination of electrochemical experiments with simple and with highly complex x-ray scattering and spectroscopy methods. Physicists and chemists can link applied electrochemistry with fundamental concepts of condensed matter physics, physical chemistry and surface science. Contents:IntroductionMolecular Structure and Electronic StructureCrystal Structure and MicrostructureReal Space Imaging and TomographyResonant Methods and Chemical Contrast VariationSurface Sensitive and Volume Sensitive MethodsOrganic and Bio-Organic SamplesComplex Case Studies / Electrochemical In Situ StudiesCorrelation of Electronic Structure And ConductivityRadiation DamagesBackground SubtractionX-Ray Physics Nobel PrizesSynchrotron Centers WorldElectromagnetic SpectrumKα,Β X-Ray EnergiesPeriodic Table of Elements


Book
Digital systems testing and testable design
Authors: --- ---
ISBN: 0716781794 9780716781790 Year: 1990 Publisher: New York, NY : [Piscataqay, New Jersey] : Computer Science Press, IEEE Xplore,

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This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.

Gettering Defects in Semiconductors
Authors: ---
ISBN: 1280346914 9786610346912 3540294996 354026244X 3642065708 9783540262442 Year: 2005 Volume: 19 Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer,

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Gettering Defects in Semiconductors fulfills three basic purposes: – to systematize the experience and research in exploiting various gettering techniques in microelectronics and nanoelectronics; – to identify new directions in research, particularly to enhance the perspective of professionals and young researchers and specialists; – to fill a gap in the contemporary literature on the underlying semiconductor-material theory. The authors address not only well-established gettering techniques but also describe contemporary trends in gettering technologies from an international perspective. The types and properties of structural defects in semiconductors, their generating and their transforming mechanisms during fabrication are described. The primary emphasis is placed on classifying and describing specific gettering techniques, their specificity arising from both their position in a general technological process and the regimes of their application. This book addresses both engineers and material scientists interested in semiconducting materials theory and also undergraduate and graduate students in solid–state microelectronics and nanoelectronics. A comprehensive list of references provides readers with direction for further reading.

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