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Book
Digital integrated circuit design using verilog and systemverilog
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ISBN: 0128101334 0124095291 0124080596 1322183996 9780124095298 9780124080591 9780124080591 9781322183992 Year: 2015 Publisher: Kidlington, England

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For those with a basic understanding of digital design, this book teaches the essential skills to design digital integrated circuits using Verilog and the relevant extensions of SystemVerilog. In addition to covering the syntax of Verilog and SystemVerilog, the author provides an appreciation of design challenges and solutions for producing working circuits. The book covers not only the syntax and limitations of HDL coding, but deals extensively with design problems such as partitioning and synchronization, helping you to produce designs that are not only logically correct, but will actually

VLSI test principles and architectures : design for testability
Authors: --- ---
ISBN: 128096684X 9786610966844 0080474799 0123705975 1493300865 9780080474793 9780123705976 Year: 2006 Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers,

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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.· Most up-to-date coverage of design for testability. · Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. · Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.· Lecture slides and exercise solutions for all chapters are now available.·

ASIC and FPGA verification : a guide to component modeling
Author:
ISBN: 1281008281 9786611008284 0080475922 0125105819 1417549718 9781417549719 9780125105811 9780080475929 Year: 2005 Publisher: San Francisco, CA : Oxford : Morgan Kaufmann ; Elsevier,

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Richard Munden demonstrates how to create and use simulation models for verifying ASIC and FPGA designs and board-level designs that use off-the-shelf digital components. Based on the VHDL/VITAL standard, these models include timing constraints and propagation delays that are required for accurate verification of today's digital designs. ASIC and FPGA Verification: A Guide to Component Modeling expertly illustrates how ASICs and FPGAs can be verified in the larger context of a board or a system. It is a valuable resource for any designer who simulates multi-chip digital designs.

Phenomena, properties, and applications
Author:
ISBN: 9780125139052 0125139055 9786613173805 0080533531 1283173808 0125139071 9780125139076 0125139063 9780125139069 Year: 1999 Publisher: San Diego : Academic Press,

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Recent developments in microelectronics technologies have created a great demand for interlayer dielectric materials with a very low dielectric constant. They will play a crucial role in the future generation of IC devices (VLSI/UISI and high speed IC packaging). Considerable efforts have been made to develop new low as well as high dielectric constant materials for applications in electronics industries. Besides achieving either low or high dielectric constants, other materials' properties such as good processability, high mechanical strength, high thermal and environmental stability, low the

Introduction to digital signal processing
Author:
ISBN: 1281036455 9786611036454 0080535003 0750650486 9780080535005 9780750650489 0340759984 9780340759981 Year: 2000 Publisher: Oxford Boston Newnes

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'Introduction to Digital Signal Processing' covers the basic theory and practice of digital signal processing (DSP) at an introductory level. As with all volumes in the Essential Electronics Series, this book retains the unique formula of minimal mathematics and straightforward explanations. The author has included examples throughout of the standard software design package, MATLAB and screen dumps are used widely throughout to illustrate the text.Ideal for students on degree and diploma level courses in electric and electronic engineering, 'Introduction to Digital Signal Processing' c


Book
New approaches to image processing based failure analysis of nano-scale ULSI devices
Authors: --- ---
ISBN: 0128000171 0323241433 1306167892 9780323241434 9780128000175 Year: 2014 Publisher: Oxford : William Andrew,

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New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices introduces the reader to transmission and scanning microscope image processing for metal and non-metallic microstructures. Engineers and scientists face the pressing problem in ULSI development and quality assurance: microscopy methods can't keep pace with the continuous shrinking of feature size in microelectronics. Nanometer scale sizes are below the resolution of light, and imaging these features is nearly impossible even with electron microscopes, due to image noise. This book pres


Book
Top-down digital VLSI design : from architectures to gate-level circuits and FPGAS
Author:
ISBN: 0128007303 Year: 2015 Publisher: [Place of publication not identified] Morgan Kaufmann is an imprint of Elsevier

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Top-Down VLSI Design: From Architectures to Gate-Level Circuits and FPGAs represents a unique approach to learning digital design. Developed from more than 20 years teaching circuit design, Doctor Kaeslin’s approach follows the natural VLSI design flow and makes circuit design accessible for professionals with a background in systems engineering or digital signal processing. It begins with hardware architecture and promotes a system-level view, first considering the type of intended application and letting that guide your design choices. Doctor Kaeslin presents modern considerations for handling circuit complexity, throughput, and energy efficiency while preserving functionality. The book focuses on application-specific integrated circuits (ASICs), which along with FPGAs are increasingly used to develop products with applications in telecommunications, IT security, biomedical, automotive, and computer vision industries. Topics include field-programmable logic, algorithms, verification, modeling hardware, synchronous clocking, and more. Demonstrates a top-down approach to digital VLSI design. Provides a systematic overview of architecture optimization techniques. Features a chapter on field-programmable logic devices, their technologies and architectures. Includes checklists, hints, and warnings for various design situations. Emphasizes design flows that do not overlook important action items and which include alternative options when planning the development of microelectronic circuits.


Book
Compact models for integrated circuit design : conventional transistors and beyond
Author:
ISBN: 1315215187 148224067X 1482240661 1138827401 1351831070 Year: 2016 Publisher: Boca Raton, Florida : CRC Press, Taylor & Francis Group,

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This modern treatise on compact models for circuit computer-aided design (CAD) presents industry standard models for bipolar-junction transistors (BJTs), metal-oxide-semiconductor (MOS) field-effect-transistors (FETs), FinFETs, and tunnel field-effect transistors (TFETs), along with statistical MOS models. Featuring exercise problems at the end of each chapter and extensive references at the end of the book, the text supplies fundamental and practical knowledge necessary for efficient integrated circuit (IC) design using nanoscale devices. It ensures even those unfamiliar with semiconductor physics gain a solid grasp of compact modeling concepts.

Semiconductor safety handbook
Author:
ISBN: 1282769464 0080946542 9786612769467 1282253239 9786612253232 0815518994 1591241510 9781591241515 9780080946542 9780815514183 0815514182 1591245370 9781591245377 9780815518990 9780815514916 0815514913 0815514913 Year: 1998 Publisher: Westwood, N.J. Noyes Publications

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Interwoven within our semiconductor technology development had been the development of technologies aimed at identifying, evaluating and mitigating the environmental, health and safety (EH&S) risks and exposures associated with the manufacturing and packaging of integrated circuits. Driving and advancing these technologies have been international efforts by SEMI's Safety Division, the Semiconductor Safety Association (SSA), and the Semiconductor Industry Association (SIA). The purpose of the Semiconductor Safety Handbook is to provide a current, single source reference for many of the

Hybrid microcircuit technology handbook
Authors: ---
ISBN: 1282711733 9786612711732 9786612011047 0080946593 159124255X 0815514239 081551798X 9781591242550 9780815514237 9780815519843 0815519842 9780080946597 9780815517986 9781282711730 6612711736 6612011041 0815515898 1282253298 0080947689 1282169300 1282011030 9786612011030 0815517947 Year: 1998 Publisher: Westwood, N.J. Noyes Publicatons

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The Hybrid Microcircuit Technology Handbook integrates the many diverse technologies used in the design, fabrication, assembly, and testing of hybrid segments crucial to the success of producing reliable circuits in high yields. Among these are: resistor trimming, wire bonding, die attachment, cleaning, hermetic sealing, and moisture analysis. In addition to thin films, thick films, and assembly processes, important chapters on substrate selections, handling (including electrostatic discharge), failure analysis, and documentation are included. A comprehensive chapter of design guidelines will

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