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ISBN: 0750639172 Year: 1999 Publisher: Oxford Butterworth-Heinemann
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ISBN: 0256247668 Year: 1999 Publisher: Boston McGraw-Hill
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ISBN: 013905720X 9780139057205 Year: 1999 Publisher: Upper Saddle River (N.J.): Prentice Hall,
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Materials. --- Materials
Article
Year: 1999
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Year: 1999 Publisher: Englewood Cliffs, NJ : Prentice-Hall,
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ISBN: 1614992266 9781614992264 9051995024 9789051995022 4274902951 9784274902956 Year: 1999 Publisher: Amsterdam Washington, DC
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The evolution of Si-based optoelectronics has been extremely fast in the last few years and it is predicted that this growth will still continue in the near future. The aim of the volume is to present different Si-based luminescing materials as porous silicon, rare-earth doped silicon, Si nanocrystals, silicides, Si-based multilayers and silicon-germanium alloy or superlattice structures. The different devices needed for an all-Si-based optoelectronics are treated, ranging from light sources to waveguides, from amplifiers and modulators to detectors. Both the very basic treatments as well as a
ISBN: 1855734249 9781855734241 9780857093141 0857093142 Year: 1999 Publisher: Cambridge
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ISBN: 9054104910 Year: 1999 Publisher: Rotterdam : Balkema,
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ISBN: 1855734249 9781855734241 9780857093141 0857093142 Year: 1999 Publisher: Cambridge
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The proceedings of a symposium held in Berlin in March 1996, drawing together practical expertise in measurement techniques, with typical applications ranging from in situ measurements of strain and rotation on small specimens through notched specimens and single crystal up to turbine blade shaped samples and full scale component testing. The symposium also highlighted new techniques such as speckle interferometry and image analysis.
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ISBN: 087849832X Year: 1999 Publisher: Zürich Trans Tech
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