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Standard test interface language (STIL) for digital test vector data.
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ISBN: 2831893372 073815721X Year: 2007 Publisher: New York : IEEE,

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Abstract

Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.


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IEC standard for extensions to standard test interface language (STIL) for DC level specification.
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ISBN: 0738157236 9782831884805 Year: 2007 Publisher: New York : IEEE,

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This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Adaptive cooling of integrated circuits using digital microfluidics
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ISBN: 1596931396 9781596931398 1596931388 9781596931381 Year: 2007 Publisher: Norwood, Massachusetts : [Piscataqay, New Jersey] : Artech House, IEEE Xplore,

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Thanks to increasing power consumption and component density, localized?hot spots? are becoming a serious challenge in IC (integrated circuit) chip design? so serious, in fact, that Intel recently had to yank a circuit because it was literally burning. For IC engineers grappling with high power dissipation and thermal issues, new droplet-based cooling techniques using digital microfluidics technology could provide the solution. This definitive guide paves the way, with design and implementation methodologies and prototypes for utilizing this groundbreaking technology. After reviewing cooling.


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Proceedings of the 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2007


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AGILE 2007 : 13-17 August, 2007, Washington, D.C
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ISBN: 0769528724 1509087753 Year: 2007 Publisher: [Place of publication not identified] IEEE Computer Society

Digital circuit analysis and design with simulink modeling
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ISBN: 1280751169 9786610751167 1934404063 9781934404065 9781934404058 1934404055 Year: 2007 Publisher: Fremont, CA : Orchard Publications,

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This book is an undergraduate level textbook presenting a thorough discussion of state-of-the-art digital devices and circuits. It is self-contained.

CMOS RFIC design principles
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ISBN: 1596931337 9781596931336 1596931329 9781596931329 Year: 2007 Publisher: Boston [Mass.] : [Piscataqay, New Jersey] : Artech House, IEEE Xplore,

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Turn to this practical resource for comprehensive, expert guidance on designing CMOS RF integrated circuits. You get complete design details on elemental and advanced CMOS RF circuits, from low noise amplifiers, general gain amplifiers, mixers, and oscillators, to voltage controlled oscillators, phase lock loops, frequency synthesizers, and power amplifier architectures. The book discusses ideal circuit topologies and then looks at non-ideal CMOS circuit elements to provide insight into circuit modifications needed to achieve design specifications. You also find a review of RF system fundament.

Phase-locked loop engineering handbook for integrated circuits
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ISBN: 1596931558 9781596931558 159693154X 9781596931541 Year: 2007 Publisher: Boston : [Piscataqay, New Jersey] : Artech House, IEEE Xplore,

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Phased-locked loops (PLLs) are control systems that have become indispensable in today's electronic circuitry. This highly accessible handbook is an practical resource that electronics engineers and circuit designers will find invaluable when developing these systems. PLLs are highly complex to design and are just as difficult to test. To speed development and ensure effective testing, engineers can turn to this collection of practical solutions, SPICE listings, simulation techniques, and testing set-ups. The book offers in-depth coverage of monolithic phase-locked loops and the latest generat.


Book
MSE 2007 : 2007 IEEE International Conference on Microelectronic Systems Education : proceedings : 3-4 June, 2007, San Diego, CA


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8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March
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ISBN: 0769527957 1509088113 Year: 2007 Publisher: [Place of publication not identified] IEEE Computer Society

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