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Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
Integrated circuits --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Testing --- Standards.
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This standard extends IEEE Std 1450-1999 (STIL) to support the definition of DC levels. STIL language constructs are defined to specify the DC conditions necessary to execute digital vectors on automated test equipment (ATE). STIL language extensions include structures for: (a) specifying the DC conditions for a device under test; (b) specifying DC conditions either globally, by pattern burst, by pattern, or by vector; (c) specifying alternate DC levels; and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.
Integrated circuits --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Testing --- Standards. --- Standards, Engineering. --- Testing.
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Thanks to increasing power consumption and component density, localized?hot spots? are becoming a serious challenge in IC (integrated circuit) chip design? so serious, in fact, that Intel recently had to yank a circuit because it was literally burning. For IC engineers grappling with high power dissipation and thermal issues, new droplet-based cooling techniques using digital microfluidics technology could provide the solution. This definitive guide paves the way, with design and implementation methodologies and prototypes for utilizing this groundbreaking technology. After reviewing cooling.
Integrated circuits --- Microfluidics. --- Fluidics --- Nanofluids --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Cooling. --- Design and construction.
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Integrated circuits --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Defects --- Testing --- Reliability
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Computer software --- Integrated circuits --- Computer Science --- Engineering & Applied Sciences --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Development --- Computer-aided design --- Very large scale integration
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This book is an undergraduate level textbook presenting a thorough discussion of state-of-the-art digital devices and circuits. It is self-contained.
Integrated circuits. --- Electronic circuits. --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics
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Turn to this practical resource for comprehensive, expert guidance on designing CMOS RF integrated circuits. You get complete design details on elemental and advanced CMOS RF circuits, from low noise amplifiers, general gain amplifiers, mixers, and oscillators, to voltage controlled oscillators, phase lock loops, frequency synthesizers, and power amplifier architectures. The book discusses ideal circuit topologies and then looks at non-ideal CMOS circuit elements to provide insight into circuit modifications needed to achieve design specifications. You also find a review of RF system fundament.
Electronic circuits. --- Integrated circuits. --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Electron-tube circuits --- Electric circuits --- Electron tubes --- Electronics
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Phased-locked loops (PLLs) are control systems that have become indispensable in today's electronic circuitry. This highly accessible handbook is an practical resource that electronics engineers and circuit designers will find invaluable when developing these systems. PLLs are highly complex to design and are just as difficult to test. To speed development and ensure effective testing, engineers can turn to this collection of practical solutions, SPICE listings, simulation techniques, and testing set-ups. The book offers in-depth coverage of monolithic phase-locked loops and the latest generat.
Integrated circuits --- Phase-locked loops --- Loops, Phase-locked --- Demodulation (Electronics) --- Oscillators, Electric --- Telecommunication --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Design and construction
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Microelectronics --- Integrated circuits --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microminiature electronic equipment --- Microminiaturization (Electronics) --- Electronics --- Microtechnology --- Semiconductors --- Miniature electronic equipment --- Study and teaching --- Design and construction
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Integrated circuits --- Electrical & Computer Engineering --- Engineering & Applied Sciences --- Electrical Engineering --- Chips (Electronics) --- Circuits, Integrated --- Computer chips --- Microchips --- Electronic circuits --- Microelectronics --- Reliability --- Very large scale integration --- Design and construction --- Computer-aided design --- Testing --- Quality control
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