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book (4)


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English (4)


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2020 (4)

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Book
2020 IEEE 38th VLSI Test Symposium (VTS)
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ISBN: 172815359X 1728153603 Year: 2020 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE),

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Book
Integrated Circuits/Microchips
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ISBN: 1839684615 1789859301 Year: 2020 Publisher: London : IntechOpen,

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Book
The Fourth Terminal : Benefits of Body-Biasing Techniques for FDSOI Circuits and Systems
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ISBN: 3030394964 3030394956 Year: 2020 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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This book discusses the advantages and challenges of Body-Biasing for integrated circuits and systems, together with the deployment of the design infrastructure needed to generate this Body-Bias voltage. These new design solutions enable state of the art energy efficiency and system flexibility for the latest applications, such as Internet of Things and 5G communications. Provides readers with a single-source reference to Body-Biasing Techniques for FDSOI Circuits and Systems; Describes integrated circuit design techniques specific to deep submicron Ultra Thin Body and Box Fully-Depleted Silicon on Insulator CMOS technology; Presents the first coherent collection of FDSOI specific design techniques, for applications ranging from analog, RF, mmW to SRAM design, embedded power management and energy efficient digital design.


Book
Ageing of Integrated Circuits : Causes, Effects and Mitigation Techniques
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ISBN: 3030237818 303023780X Year: 2020 Publisher: Cham : Springer International Publishing : Imprint: Springer,

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This book provides comprehensive coverage of the latest research into integrated circuits’ ageing, explaining the causes of this phenomenon, describing its effects on electronic systems, and providing mitigation techniques to build ageing-resilient circuits. Describes in detail the physical mechanisms of CMOS ageing; Provides an in-depth discussion on the impact of ageing on the performance and reliability of integrated circuits; Presents state-of-the art synthesis algorithms for ageing resilient digital systems; Introduces application-dependent techniques to mitigate the effects of aging; Discusses the design and implementation of on-chip aging monitoring sensors for aging-adaptable systems; Includes more than 200 references on state-of-art research in this area, providing direction for further reading.

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