TY - JFULL ID - 1267978 TI - Surface and interface analysis. PY - 1979 SN - 01422421 10969918 PB - New York, NY : John Wiley & Sons DB - UniCat KW - Experimental solid state physics KW - Materials sciences KW - Surfaces (Physics) KW - Surface chemistry KW - Thin films KW - Surfaces (Physique) KW - Chimie des surfaces KW - Couches minces KW - Periodicals KW - Periodicals. KW - Périodiques KW - E-journals KW - 541.183 <05> KW - Contact systems. Adsorption. Surface chemistry--Tijdschriften KW - Chemistry KW - Electrochemistry KW - General and Others KW - Physical Chemistry KW - Electronics KW - Coatings and Films KW - Engineering KW - Material Science and Metallurgy KW - Physics KW - Chemistry. KW - Coatings and Films. KW - Engineering. KW - Material Science and Metallurgy. KW - 541.183 <05> Contact systems. Adsorption. Surface chemistry--Tijdschriften KW - Périodiques KW - EJCHIMI EJPHYSI EPUB-ALPHA-S EPUB-PER-FT WILEY-E KW - Films, Thin KW - Solid film KW - Solid state electronics KW - Solids KW - Surfaces (Technology) KW - Coatings KW - Thick films UR - https://www.unicat.be/uniCat?func=search&query=sysid:1267978 AB - ER -