TY - BOOK ID - 135278169 TI - Semiconductor measurement technology : the theoretical and experimental study of the temperature and dopant density dependence of hole mobility, effective mass and resistivity in boron-doped silicon PY - 1979 PB - Washington (D.C.): Department of commerce. National bureau of standards DB - UniCat UR - https://www.unicat.be/uniCat?func=search&query=sysid:135278169 AB - ER -