TY - BOOK ID - 9874173 TI - ETC 93 : third European test conference. AU - European Test Conference AU - Convention of National Societies of Electrical Engineers of Europe AU - IEEE Computer Society AU - Institute of Electrical and Electronics Engineers. AU - I.E.E.E. Computer Society AU - IEEE Society on Computers AU - Computer Society of the IEEE AU - Computer Society (Institute of Electrical and Electronics Engineers) AU - IEEE CS AU - EUREL AU - Convention of Societies of Electrical Engineers of Europe AU - Convention des sociétés nationales d'électriciens de l'Europe AU - Föderation der Nationalen Elektrotechnischen Vereinigungen Europas PY - 1993 SN - 0818633603 PB - Los Alamitos IEEE computer society press DB - UniCat KW - 621.3.049.77 KW - Integrated circuits KW - Automatic checkout equipment KW - -ACE (Automatic checkout equipment) KW - ATE (Automatic test equipment) KW - Built-in test equipment KW - Electronic instruments KW - Nondestructive testing KW - Chips (Electronics) KW - Circuits, Integrated KW - Computer chips KW - Microchips KW - Electronic circuits KW - Microelectronics KW - Microelectronics. Integrated circuits KW - Testing KW - -Congresses. KW - Congresses KW - Equipment and supplies KW - Automatic test equipment KW - Electrical & Computer Engineering KW - Engineering & Applied Sciences KW - Electrical Engineering KW - -Microelectronics. Integrated circuits KW - 621.3.049.77 Microelectronics. Integrated circuits KW - -621.3.049.77 Microelectronics. Integrated circuits KW - ACE (Automatic checkout equipment) UR - https://www.unicat.be/uniCat?func=search&query=sysid:9874173 AB - ER -