ID - 2744613 TI - Electromigration issues for advanced Al interconnects AU - Proost, Joris AU - Maex, Karen AU - Delaey, Luc AU - KU Leuven. Faculty of engineering science. Department of materials engineering PY - 1998 SN - 9056821571 PB - Leuven KU Leuven. Faculteit Toegepaste Wetenschappen DB - UniCat KW - Academic collection KW - #BIBC:T1998 KW - Theses UR - https://www.unicat.be/uniCat?func=search&query=sysid:2744613 AB - ER -