TY - BOOK ID - 2844726 TI - Total least squares and errors-in-variables modeling : analysis, algorithms and applications AU - Van Huffel, Sabine AU - Lemmerling, Philippe PY - 2002 SN - 1402004761 9048159571 9401735522 PB - Dordrecht ; Boston ; London Kluwer Academic Publishers DB - UniCat KW - Least squares KW - Error analysis (Mathematics) KW - Academic collection KW - 681.3*I54 KW - Errors, Theory of KW - Instrumental variables (Statistics) KW - Mathematical statistics KW - Numerical analysis KW - Statistics KW - Method of least squares KW - Squares, Least KW - Curve fitting KW - Geodesy KW - Mathematics KW - Probabilities KW - Triangulation KW - Applications: computer vision; signal processing; text processing; waveform analysis (Pattern recognition) KW - Least squares. KW - Error analysis (Mathematics). KW - 681.3*I54 Applications: computer vision; signal processing; text processing; waveform analysis (Pattern recognition) KW - Algebra. KW - Matrix theory. KW - StatisticsĀ . KW - Applied mathematics. KW - Engineering mathematics. KW - Numerical analysis. KW - Algorithms. KW - Linear and Multilinear Algebras, Matrix Theory. KW - Statistics, general. KW - Applications of Mathematics. KW - Numeric Computing. KW - Algorism KW - Algebra KW - Arithmetic KW - Mathematical analysis KW - Engineering KW - Engineering analysis KW - Statistical analysis KW - Statistical data KW - Statistical methods KW - Statistical science KW - Econometrics KW - Foundations UR - https://www.unicat.be/uniCat?func=search&query=sysid:2844726 AB - In response to a growing interest in Total Least Squares (TLS) and Errors-In-Variables (EIV) modeling by researchers and practitioners, well-known experts from several disciplines were invited to prepare an overview paper and present it at the third international workshop on TLS and EIV modeling held in Leuven, Belgium, August 27-29, 2001. These invited papers, representing two-thirds of the book, together with a selection of other presented contributions yield a complete overview of the main scientific achievements since 1996 in TLS and Errors-In-Variables modeling. In this way, the book nicely completes two earlier books on TLS (SIAM 1991 and 1997). Not only computational issues, but also statistical, numerical, algebraic properties are described, as well as many new generalizations and applications. Being aware of the growing interest in these techniques, it is a strong belief that this book will aid and stimulate users to apply the new techniques and models correctly to their own practical problems. ER -