TY - BOOK ID - 29974884 TI - Scanning electron microscopy and X-ray microanalysis. AU - Goldstein, Joseph AU - Newbury, Dale AU - Echlin, Patrick AU - Joy, David C. AU - Lyman, Charles AU - Lifshin, Eric AU - Sawyer, Linda AU - Michael, Joseph PY - 2003 SN - 9780306472923 0306472929 1461349699 1461502152 9781461502159 PB - New York (N.Y.) Springer DB - UniCat KW - 620.18 KW - 620.18 Investigation of structure of materials. Metallography. Analogous study of non-metals KW - Investigation of structure of materials. Metallography. Analogous study of non-metals KW - Electron Probe Microanalysis. KW - Microscopy, Electron, Scanning. KW - Scanning electron microscopy. KW - X-ray microanalysis. KW - Microscopie électronique à balayage KW - Microanalyse aux rayons X KW - Science (General). KW - X-ray microanalysis KW - Scanning electron microscopy KW - Monograph KW - E-books KW - Materials science. KW - Microscopy. KW - Materials—Surfaces. KW - Thin films. KW - Nanotechnology. KW - Characterization and Evaluation of Materials. KW - Materials Science, general. KW - Science, Humanities and Social Sciences, multidisciplinary. KW - Biological Microscopy. KW - Surfaces and Interfaces, Thin Films. KW - Molecular technology KW - Nanoscale technology KW - High technology KW - Films, Thin KW - Solid film KW - Solid state electronics KW - Solids KW - Surfaces (Technology) KW - Coatings KW - Thick films KW - Analysis, Microscopic KW - Light microscopy KW - Micrographic analysis KW - Microscope and microscopy KW - Microscopic analysis KW - Optical microscopy KW - Optics KW - Material science KW - Physical sciences UR - https://www.unicat.be/uniCat?func=search&query=sysid:29974884 AB - Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--P. [4] of cover. ER -