Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts. The intention is to provide a general textbook for all types of classes that address scanning probe microscopy. Third year undergraduates and beyond should be able to use it for self-study or as textbook to accompany a course on probe microscopy. Furthermore, it will be valuable as reference book in any scanning probe microscopy laboratory. Novel applications and the latest important results are also presented, and the book closes with a look at the future prospects of scanning probe microscopy, also discussing related techniques in nanoscience. Ideally suited as an introduction for graduate students, the book will also serve as a valuable reference for practising researchers developing and using scanning probe techniques.

Scanning probe microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Spectroscopy. --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Physical measurements. --- Measurement   . --- Solid state physics. --- Condensed matter. --- Nanotechnology. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Measurement Science and Instrumentation. --- Solid State Physics. --- Condensed Matter Physics. --- Condensed materials --- Condensed media --- Condensed phase --- Materials, Condensed --- Media, Condensed --- Phase, Condensed --- Liquids --- Matter --- Solids --- Physics --- Measuring --- Mensuration --- Mathematics --- Technology --- Metrology --- Physical measurements --- Measurements, Physical --- Mathematical physics --- Measurement --- Films, Thin --- Solid film --- Solid state electronics --- Surfaces (Technology) --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectrometry --- Spectroscopy --- Analytical chemistry --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Molecular technology --- Nanoscale technology --- High technology --- Qualitative

Choose an application

• Reference Manager
• EndNote
• RefWorks (Direct export to RefWorks)

Measuring methods in physics --- Quantum mechanics. Quantumfield theory --- Statistical physics --- Solid state physics --- Matter physics --- Surface chemistry --- Theoretical spectroscopy. Spectroscopic techniques --- Chemical technology --- meetmethoden --- EMI (electromagnetic interference) --- materie (fysica) --- quantummechanica --- meettechniek --- spectroscopie --- fysica --- fysicochemie