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Secondary ion mass spectrometry SIMS XI : proceedings of the eleventh international conference on secondary ion mass spectrometry, Orlando, Florida, september 7-12th, 1997
Authors: Gillen, G. --- Lareau, Richard --- Bennett, Joe --- Stevie, F. A. --- International Conference on Secondary Ion Mass Spectrometry
ISBN: 0471978264 Year: 1998 Publisher: Chichester : John Wiley & Sons,

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Abstract

Keywords
Secondary ion mass spectrometry --- Spectrométrie de masse des ions secondaires.

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