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book (31)


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Microbial food contamination
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ISBN: 0849322294 Year: 2001 Publisher: Boca Raton (Fla) CRC

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Exotic plant pests and North American agriculture
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ISBN: 0127578803 Year: 1983 Publisher: New York : Academic Press,

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MOS1 : a program for two-dimensional analysis of Si MOSFETs
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Year: 1985 Publisher: Washington (D.C.): Department of commerce. National bureau of standards

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MOS1 a program for two-dimensional analysis of Si MOSFETs
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Year: 1985 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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MOS1 a program for two-dimensional analysis of Si MOSFETs
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Year: 1985 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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NIST biometrics evaluations and developments
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Year: 2005 Publisher: [Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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This paper presents an R & D framework used by the National Institute of Standards and Technology (NIST) for biometric technology testing and evaluation. The focus of this paper is on fingerprint-based verification and identification. Since 9-11 the NIST Image Group has been mandated by Congress to run a program for biometric technology assessment and biometric systems certification. Four essential areas of activity are discussed: 1.) developing test datasets, 2.) conducting performance assessment; 3.) technology development; and 4.) standards participation. A description of activities and accomplishments are provided for each of these areas. In the process, methods of performance testing are described and results from specific biometric technology evaluations are presented. This framework is anticipated to have broad applicability to other technology and application domains.


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Using Chebyshev's inequality to determine sample size in biometric evaluation of fingerprint data
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Year: 2005 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Nonparamentric analysis of fingerprint data
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Year: 2005 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Fingerprint image quality
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Year: 2004 Publisher: [Gaithersburg, Md.] : National Institute of Standards and Technology,

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Studies of plain-to-rolled fingerprint matching using the NIST Algorithmic Test Bed (ATB)
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Year: 2004 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,

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