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ISBN: 1118717252 1118650743 1118717244 9781118717257 9781118650721 9781118717240 9781118650745 Year: 2013 Publisher: Hoboken, New Jersey [Piscataqay, New Jersey] Wiley IEEE Xplore
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A comprehensive, practical book on software management that dispels real-world issues through relevant case studiesSoftware managers inevitably will meet obstacles while trying to deliver quality products and provide value to customers, often with tight time restrictions. The result: Software War Stories.This book provides readers with practical advice on how to handle the many issues that can arise as a software project unfolds. It utilizes case studies that focus on what can be done to establish and meet reasonable expectations as they occur in government, industrial, and academic settings. The book also offers important discussions on both traditional and agile methods as well as lean development concepts.Software War Stories:. Covers the basics of management as applied to situations ranging from agile projects to large IT projects with infrastructure problems. Includes coverage of topics ranging from planning, estimating, and organizing to risk and opportunity management. Uses twelve case studies to communicate lessons learned by the author in practice. Offers end-of-chapter exercises, sample solutions, and a blog for providing updates and answers to readers' questionsSoftware War Stories: Case Studies in Software Management mentors practitioners, software engineers, students and more, providing relevant situational examples encountered when managing software projects and organizations.
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Year: 2019 Publisher: Germany : KIT Scientific Publishing,
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The state of the art in optical characterization of materials is advancing rapidly. New insights into the theoretical foundations of this research field have been gained and exciting practical developments have taken place, both driven by novel applications that are constantly emerging. This book presents latest research results in the domain of Characterization of Materials by spectral characteristics of UV (240 nm) to IR (14 µm), multispectral image analysis, X-Ray, polarimetry and microscopy.
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Year: 2012 Publisher: [Place of publication not identified] IEEE
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Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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ISBN: 007707923X 9780077079239 Year: 1994 Publisher: London: McGraw-Hill,
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ISBN: 9783540208679 3540208674 Year: 2005 Publisher: Berlin: Springer,
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Year: 2012 Publisher: [Place of publication not identified] IEEE
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Year: 2013 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,
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ISBN: 1351176358 1000740560 1315314428 131531441X Year: 2017 Publisher: Boca Raton : Taylor & Francis, a CRC title, part of the Taylor & Francis imprint, a member of the Taylor & Francis Group, the academic division of T&F Informa, plc,
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Software measurement practices are so bad that the industry has very sparse reliable data on software schedules, costs, quality, and productivity. Much of the available data is incorrect, incomplete, or both. This book provides quantified software results by country, by industry, by technology, by application size, and by other factors.
ISBN: 020174158X 9780201741582 Year: 2002 Publisher: Boston, Mass. Pearson
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