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Auger effect --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Auger effect.

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Auger [Effet d' ] --- Auger effect --- Auger-effect --- 543.42 --- Metals --- -538.97 --- Metallic elements --- Chemical elements --- Ores --- Metallurgy --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- Spectra --- Special geometry and interaction with particles and radiation --- 538.97 Special geometry and interaction with particles and radiation --- 543.42 Spectrum analysis. Spectroscopy. Spectrography. Spectrometry. Spectrophotometry. Fluorescence analysis --- 538.97 --- Monograph

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Materials --- Instrumental analysis --- Materiaux --- Analyse instrumentale --- Analysis --- Analyse --- -Engineering --- Engineering materials --- Industrial materials --- Engineering design --- Manufacturing processes --- Chemistry, Analytic --- Chemistry, Physical and theoretical --- -Analysis --- -Chemistry, Analytic --- Engineering --- LEED --- ELECTRON SPIN RESONANCE --- MICROANALYSIS --- AUGER EFFECT --- CHROMATOGRAPHY --- SPECTROSCOPY --- INFRARED RADIATION --- Monograph --- Electron paramagnetic resonance. --- Auger effect. --- Chromatographic analysis. --- Spectrum analysis. --- Infrared radiation. --- Infra-red rays --- Infrared rays --- Radiation, Infrared --- Rays, Infrared --- Electromagnetic waves --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Interferometry --- Optics --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Analysis, Chromatographic --- Chromatography --- Phase partition --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Electron resonance --- Electron spin resonance --- EPR (Magnetic resonance) --- ESR (Magnetic resonance) --- Paramagnetic resonance, Electron --- Magnetic resonance --- Paramagnetism --- Qualitative --- -Analytical chemistry --- Spectrometry --- Analytical chemistry

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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.  .

X-ray photoelectron spectroscopy. --- Auger effect. --- Auger spectroscopy --- Auto-ionization --- Autoionization --- ESCA (Electron spectroscopy for chemical analysis) --- XPS (X-ray photoelectron spectroscopy) --- Physics. --- Solid state physics. --- Spectroscopy. --- Microscopy. --- Materials --- Thin films. --- Solid State Physics. --- Spectroscopy and Microscopy. --- Surfaces and Interfaces, Thin Films. --- Surfaces. --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Physics --- Natural philosophy --- Philosophy, Natural --- Physical sciences --- Dynamics --- Surfaces --- Qualitative --- Electron spectroscopy for chemical analysis --- Photoelectron spectroscopy --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Surfaces (Physics). --- Surface chemistry --- Materials—Surfaces. --- Spectrometry --- Analytical chemistry

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The Auger effect must be interpreted as the radiationless counterpart of photoionization and is usually described within a two-step model. Angle and spin resolved Auger emission physics deals with the theoretical and numerical description, analysis and interpretation of such types of experiments on free atoms and molecules. This monograph derives the general theory applying the density matrix formalism and, in terms of irreducible tensorial sets, so called state multipoles and order parameters, for parameterizing the atomic and molecular systems, respectively. Propensity rules and non-linear dependencies between the angular distribution and spin polarization parameters are included in the discussion. The numerical approaches utilizing relativistic distorted wave (RDWA), multiconfigurational Dirac-Fock (MCDF), and Greens operator methods are described. These methods are discussed and applied to theoretical predictions, numerical results and experimental data for a variety of atomic systems, especially the rare gases, and to simple molecules. The book was written for graduate and post-graduate students and researchers working in this field and/or trying to get a closer insight into the theoretical description of multistep scattering processes in atomic and molecular physics.

Auger effect. --- Auger effect --- Physics --- Chemistry --- Physical Sciences & Mathematics --- Physical & Theoretical Chemistry --- Atomic Physics --- Electricity & Magnetism --- Materials --- Analysis. --- Auger spectroscopy --- Auto-ionization --- Autoionization --- Physics. --- Atoms. --- Atomic structure. --- Molecular structure. --- Spectra. --- Surfaces (Physics). --- Interfaces (Physical sciences). --- Thin films. --- Spectroscopy. --- Microscopy. --- Atomic, Molecular, Optical and Plasma Physics. --- Surface and Interface Science, Thin Films. --- Spectroscopy and Microscopy. --- Atomic/Molecular Structure and Spectra. --- Optics, Lasers, Photonics, Optical Devices. --- Surfaces and Interfaces, Thin Films. --- Surfaces. --- Surface phenomena --- Friction --- Surfaces (Physics) --- Tribology --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Analysis, Spectrum --- Spectra --- Spectrochemical analysis --- Spectrochemistry --- Spectroscopy --- Chemistry, Analytic --- Interferometry --- Radiation --- Wave-motion, Theory of --- Absorption spectra --- Light --- Spectroscope --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Surface chemistry --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Chemistry, Physical and theoretical --- Matter --- Stereochemistry --- Natural philosophy --- Philosophy, Natural --- Physical sciences --- Dynamics --- Surfaces --- Qualitative --- Constitution --- Electrons --- Internal conversion (Nuclear physics) --- Ionization --- Nuclear physics --- X-rays --- Scanning Auger electron microscopy --- Atomic structure  . --- Molecular structure . --- Lasers. --- Photonics. --- Materials—Surfaces. --- New optics --- Light amplification by stimulated emission of radiation --- Masers, Optical --- Optical masers --- Light amplifiers --- Light sources --- Optoelectronic devices --- Nonlinear optics --- Optical parametric oscillators --- Spectrometry --- Analytical chemistry