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Periodical
International journal of design, analysis and tools for integrated circuits and systems.
ISSN: 20712987 Year: 2011 Publisher: Hong Kong : Solari (HK) Co.,

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Book
2005 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005
Authors: --- ---
ISBN: 0780389921 1509097732 Year: 2005 Publisher: [Place of publication not identified] IEEE Electron Devices Society

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2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits and Systems
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ISBN: 142446613X 1424466121 Year: 2010 Publisher: [Place of publication not identified] IEEE

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Book
Standard test interface language (STIL) for digital test vector data.
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ISBN: 2831893372 073815721X Year: 2007 Publisher: New York : IEEE,

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Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.


Book
2013 Symposium on VLSI Circuits
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ISBN: 4863483481 1467355313 Year: 2013 Publisher: [Place of publication not identified] IEEE

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2013 IEEE International Symposium on Circuits and Systems (ISCAS)
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ISBN: 1467357626 146735760X Year: 2013 Publisher: [Place of publication not identified] IEEE

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Book
2006 IEEE Custom Integrated Circuits Conference
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ISBN: 1424400759 1424400767 1509095012 Year: 2006 Publisher: [Place of publication not identified] I E E E

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Book
2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits
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ISBN: 1467309834 146730980X Year: 2012 Publisher: [Place of publication not identified] IEEE

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Book
European Solid-State Circuits Conference (ESSCIRC), ESSCIRC 2015 - 41st
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ISBN: 1467374709 1467374733 1467374725 Year: 2015 Publisher: [Place of publication not identified] : Institute of Electrical and Electronics Engineers,

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The ESSCIRC conference is collocated with the ESSDERC conference at the same time The aim of ESSCIRC is to provide an annual European forum for the presentation and discussion of recent advances in solid state devices and circuits The increasing level of integration for system on chip design made available by advances in silicon technology is, more than ever before, calling for a deeper interaction among technologists, device experts, IC designers, and system designers While keeping separate Technical Program Committees, ESSCIRC and ESSDERC are governed by a common Steering Committee and share Plenary Keynote Presentations and Joint Sessions bridging both communities Attendees registered for either conference are encouraged to attend any of the scheduled parallel sessions, regardless to which conference they belong.


Book
2016 International Symposium on Integrated Circuits (ISIC)
Author:
ISBN: 1467390194 1467390208 Year: 2016 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers (IEEE),

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The symposium provides a forum for IC design engineers, semiconductor process engineers and device physicists and academics to share and discuss new research directions, problems, ideas, techniques and applications related to integrated devices, circuits and systems. It will also provide a good opportunity for delegates to meet and network with distinguished invited speakers and other researchers from all over the world.

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