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Scanning probe microscopy --- Microscopie à sonde à balayage --- Congresses --- Congrès --- 537.533.35 --- #WSCH:MODS --- Electron microscopy --- 537.533.35 Electron microscopy --- Microscopie à sonde à balayage --- Congrès

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Atom probe microscopy enables the characterization of materials structure and chemistry in three dimensions with near-atomic resolution. This uniquely powerful technique has been subject to major instrumental advances over the last decade with the development of wide-field-of-view detectors and pulsed-laser-assisted evaporation that have significantly enhanced the instrument's capabilities. The field is flourishing, and atom probe microscopy is being embraced as a mainstream characterization technique. This book covers all facets of atom probe microscopy including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels. It will provide the beginner with the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques. This includes detailed explanations of the fundamentals and the instrumentation, contemporary specimen preparation techniques, experimental details, and an overview of the results that can be obtained. The book emphasizes processes for assessing data quality, and the proper implementation of advanced data mining algorithms. Those more experienced in the technique will benefit from the book as a single comprehensive source of indispensable reference information, tables and techniques. Both beginner and expert will value the way that Atom Probe Microscopy is set out in the context of materials science and engineering, and includes references to key recent research outcomes. Provides the most practical, up-to-date and critical review of  atom probe microscopy techniques Presents a detailed description of the analysis tools Includes practical examples of how the technique can be used in materials science research Stands as a must-have reference for any user of atom probe microscopy

Optics. Quantum optics --- Chemical structure --- Theoretical spectroscopy. Spectroscopic techniques --- Chemistry --- Materials sciences --- Electrical engineering --- moleculen --- materiaalkennis --- nanotechniek --- chemie --- spectroscopie --- microscopie --- atomen --- Atomic force microscopy. --- Scanning probe microscopy. --- Atom-probe field ion microscopy. --- Microscopie à force atomique --- Microscopie à sonde à balayage --- Microscopie ionique à champ et sonde atomique --- EPUB-LIV-FT LIVCHIMI SPRINGER-B

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The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner Harbor Hotelin Baltimore, Maryland, from May 9 to 12, 1998. This book represents the compilation of papers that were presented at the AFM/STM Symposium as well as a few that were presented at SCANNING 96 and SCANNING 97 meetings that took place in Monterey, California. The purpose of the symposium was to provide an interface between scientists and engineers, representatives of industry, government and academia, all of whom have a common interest in probe microscopies. The meetings offered an ideal forum where ideas could easily be exchanged and where individuals from diverse fields who are on the cutting edge ofprobe microscopy research could communicate with one another. Experts in probe microscopy from around the world representing a wide range of disciplines including physics, biotechnology, nanotechnology, chemistry, material science, etc., were invited to participate. The format of the meeting was structured so as to encourage communication among these individuals. During the first day’s sessions papers were presented on general topics such as application of scanning probe microscopy in materials science; STM and scanning tunneling spectroscopy of organic materials; fractal analysis in AFM; and nanomanipulation. Other papers presented included unexpected ordering of a molecule; synthesis ofpeptides and oligonucleotides; and analysis oflunar soils from Apollo 11.

Atomic force microscopy --- Scanning tunneling microscopy --- Scanning probe microscopy --- Microscopie à force atomique --- Microscopie à sonde à balayage --- Congresses. --- Congresses --- Congrès --- EPUB-LIV-FT SPRINGER-B --- Surfaces (Physics). --- Microscopy. --- Analytical biochemistry. --- Characterization and Evaluation of Materials. --- Biological Microscopy. --- Analytical Chemistry. --- Atomic/Molecular Structure and Spectra. --- Materials science. --- Analytical chemistry. --- Atomic structure  . --- Molecular structure . --- Structure, Molecular --- Chemical structure --- Structural bioinformatics --- Structure, Atomic --- Atomic theory --- Analysis, Chemical --- Analytic chemistry --- Chemical analysis --- Chemistry, Analytic --- Chemistry --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Material science --- Physical sciences --- Atomic force microscopy - Congresses --- Scanning tunneling microscopy - Congresses