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Book
MEMSYS 2016 : proceedings of the International Symposium on Memory Systems : Washington DC, October 3-6, 2016
Authors: ---
ISBN: 1450343058 Year: 2016 Publisher: New York : ACM,

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Book
IMW : 2015 IEEE 7th International Memory Workshop : Monterey, CA, 17-20 May 2015
Authors: ---
ISBN: 1467369314 1467369349 1467369330 Year: 2015 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,


Book
2017 IEEE North Atlantic Test Workshop (NATW)
Author:
ISBN: 1509059024 1509059032 Year: 2017 Publisher: Piscataway, NJ : IEEE,

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Annotation The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs In addition to traditional topics, the 26th NATW will feature a general theme of Synthesis and Reliability Topics are not limited to, the following Analog, Mixed Signal and RF Testing Built In Self Test (BIST) Board Level Testing Delay and Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA and Embedded Core Testing IDDQ Testing DFM, Defect Analysis and Defect Based Testing Memory and MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test and DebugTest Quality System Reliability.


Book
IMW 2018 : 2018 IEEE 10th International Memory Workshop : The Westin Miyako, Kyoto, Japan, 13-16 May 2018
Authors: ---
ISBN: 1538652471 153865248X Year: 2018 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,


Book
IMW 2019 : 2019 IEEE 11th International Memory Workshop : 12-15 May 2019, Monterey, California, USA
Authors: ---
ISBN: 1728109817 1728109825 Year: 2019 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,


Book
Advances in non-volatile memory and storage technology
Author:
ISBN: 0857098098 0857098039 9780857098092 9780857098030 Year: 2014 Publisher: Cambridge, England ; Waltham, Massachusetts : Woodhead Publishing,

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Non-volatile memory retains its data when the power supply is removed and is thus invaluable for data storage. However, new solutions are needed for future development because solid-state non-volatile memory (flash), while useful, is limited. This book presents a systematic overview of the emerging technologies designed to address this issue. After an overview of the current market, part one introduces improvements in flash technologies including developments in 3D NAND flash technologies and flash memory for ultra high density storage devices. Part two looks at the advantages of des


Book
2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings


Book
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan


Book
MTDT 2009 : 2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
Authors: --- ---
ISBN: 0769537979 1509073353 Year: 2009 Publisher: [Place of publication not identified] IEEE Computer Society


Book
2018 IEEE 27th North Atlantic Test Workshop : 7-9 May 2018, Essex, VT, USA
Authors: ---
ISBN: 1538664003 1538664011 Year: 2018 Publisher: Piscataway, New Jersey : Institute of Electrical and Electronics Engineers,

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