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Accurate measurement at the nano-scale - nanometrology - is a critical tool for advanced nanotechnology applications, where exact quantities and engineering precision are beyond the capabilities of traditional measuring techniques and instruments. Scanning Probe Microscopy (SPM) builds up a picture of a specimen by scanning with a physical probe; unrestrained by the wavelength of light or electrons, the resolution obtainable with this technique can resolve atoms. SPM instruments include the Atomic Force Microscope (AFM) and Scanning Tunneling Microscope (STM). Despite tremendous adv
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Gravimetric and volumetric analysis --- Scanning probe microscopy. --- Microscopie à sonde à balayage --- Scanned probe microscopy --- Microscopie à sonde à balayage --- Scanning probe microscopy --- #WSCH:MODS --- 537.533.35 --- Scanning electron microscopy --- 537.533.35 Electron microscopy --- Electron microscopy
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In this volume, the author argues that this technology-centric view does not explain how these microscopes helped to launch nanotechnology - and fails to acknowledge the agency of the microscopists in making the STM and its variants critically important tools.
Nanotechnology --- Scanning probe microscopy. --- Intellectual cooperation --- Scientists --- Research --- Professional employees --- Cooperation, Intellectual --- Cultural exchange programs --- International cooperation --- International education --- Library cooperation --- Scanned probe microscopy --- Scanning electron microscopy --- Molecular technology --- Nanoscale technology --- High technology --- SCIENCE, TECHNOLOGY & SOCIETY/General --- Scanning probe microscopy
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Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality h
Electric batteries --- Scanning probe microscopy --- Scanned probe microscopy --- Scanning electron microscopy --- Batteries, Electric --- Batteries (Electricity) --- Cell, Voltaic --- Electrical batteries --- Electrochemical cells --- Galvanic batteries --- Voltaic cell --- Electric power supplies to apparatus --- Electrochemistry --- Thermopiles --- Research. --- Industrial applications.
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Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging applications of spectroscopic imaging and multifrequency SPM methods, thermomechanical characterization, ion-conductance microscopy, as well as combined SPM-mass spectrometry, SPM-patch clamp, and SPM-focused X-ray applications. By bringing together critical reviews by leading researchers on the application of SPM to the nanoscale characterization of functional materials properties, Scanning Probe Microscopy of Functional Materials provides insight into fundamental and technological advances and future trends in key areas of nanoscience and nanotechnology. Key Features: •Serves the rapidly developing field of nanoscale characterization of functional materials properties •Covers electrical, electromechanical, magnetic, and chemical properties of diverse materials including complex oxides, biopolymers, and semiconductors •Focuses on recently emerging areas such as nanoscale chemical reactions, electromechanics, spin effects, and molecular vibrations •Combines theoretical aspects with applications ranging from fundamental physical studies to device characterization.
Nanotechnology. --- Scanning electron microscopy. --- Scanning probe microscopy --- Scanning electron microscopy --- Nanotechnology --- Chemical & Materials Engineering --- Biology --- Health & Biological Sciences --- Engineering & Applied Sciences --- Microscopy --- Materials Science --- Scanning probe microscopy. --- Scanned probe microscopy --- Materials science. --- Materials Science. --- Characterization and Evaluation of Materials. --- Electron microscopy --- Surfaces (Physics). --- Physics --- Surface chemistry --- Surfaces (Technology) --- Material science --- Physical sciences
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537.533.35 <063> --- Scanning probe microscopy --- -Scanning tunneling microscopy --- -#WSCH:MODS --- STM (Microscopy) --- Scanned probe microscopy --- Scanning electron microscopy --- 537.533.35 <063> Electron microscopy--Congressen --- Electron microscopy--Congressen --- Congresses --- Scanning tunneling microscopy --- #WSCH:MODS --- Scanning probe microscopy - Congresses. --- Scanning tunneling microscopy - Congresses. --- Scanning tunneling microscopy - Congresses --- Scanning probe microscopy - Congresses
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Many of the devices and systems used in modern industry are becoming progressively smaller and have reached the nanoscale domain. Nanofabrication aims at building nanoscale structures, which can act as components, devices, or systems, in large quantities at potentially low cost. Nanofabrication is vital to all nanotechnology fields, especially for the realization of nanotechnology that involves the traditional areas across engineering and science. This is the first book solely dedicated to the manufacturing technology in nanoscale structures, devices, and systems and is designed to satisfy th
Lithography, Electron beam. --- Nanostructured materials. --- Nanostructures. --- Scanning probe microscopy. --- Scanned probe microscopy --- Scanning electron microscopy --- Nanoscience --- Physics --- Electron beam lithography --- Electron beams --- Microelectronics --- Photolithography --- Nanomaterials --- Nanometer materials --- Nanophase materials --- Nanostructure controlled materials --- Nanostructure materials --- Ultra-fine microstructure materials --- Microstructure --- Nanotechnology --- Industrial applications
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