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Scan & retouche d'images
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Year: 1999 Publisher: Paris CampusPress

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Scanning systems


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Risk management for replication devices
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Year: 2015 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Printers --- Scanning systems --- 3rd.


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Refracted-ray scanning (refracted near-field scanning) for measuring index profiles of optical fibers
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Year: 1981 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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De-interlacing : a key technology for scan rate conversion
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ISBN: 0444505946 Year: 2000 Publisher: Amsterdam : Elsevier,

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Refracted-ray scanning (refracted near-field scanning) for measuring index profiles of optical fibers
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Year: 1981 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Development of a profiling scanner
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Year: 2008 Publisher: Adelphi, MD : Army Research Laboratory,

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U.S. Army Research Laboratory Microelectromechanical System electronically scanned antenna testing at the Aviation and Missile Research, Development and Engineering Center
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Year: 2008 Publisher: Adelphi, MD : Army Research Laboratory,

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Risk management for replication devices
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Year: 2015 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Abstract

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Printers --- Scanning systems --- 3rd. --- 3rd.


Book
Development of a profiling scanner
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Year: 2008 Publisher: Adelphi, MD : Army Research Laboratory,

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U.S. Army Research Laboratory Microelectromechanical System electronically scanned antenna testing at the Aviation and Missile Research, Development and Engineering Center
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Year: 2008 Publisher: Adelphi, MD : Army Research Laboratory,

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