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A user's guide to ellipsometry
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ISBN: 9780486450285 0486450287 Year: 2006 Publisher: Mineola, N.Y. : Dover Publications,

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Ellipsometry for industrial applications
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ISBN: 9783211820407 321182040X 9780387820408 038782040X Year: 1988 Publisher: Wien: Springer,

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Keywords

Thin films --- Ellipsometry


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Mueller matrix ellipsometry studies of nanostructured materials
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ISBN: 9175192004 Year: 2014 Publisher: Linköping, Sweden : Linköpings universitet. Institute of Technology,

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Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices : Phase II, annual technical report, January 2006 - February 2007
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Year: 2007 Publisher: Golden, Colo. : National Renewable Energy Laboratory,

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Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices : final report, December 2004 - January 2009
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Year: 2009 Publisher: Golden, Colo. : National Renewable Energy Laboratory,

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Spectroscopic ellipsometry of interfacial phase transitions in fluid metallic systems: KxKCl1-x and Ga1-xBix [online]
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Year: 2004 Publisher: KIT Scientific Publishing

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The investigation of the interfacial phase transitions in fluid systems with short-range intermetallic interactions are of great interest. The phenomena were studied in two systems exhibiting a liquid-liquid miscibility gap: at the fluid/wall interface in fluid KxKCl1-x and at the fluid/vacuum interface of the Ga1 xBix alloys. To characterize the interfacial changes of the ultra thin films (composition, thickness and their evolution with time) the spectroscopic ellipsometry was performed over a wide spectral range. Whereas in the experiments on KxKCl1-x an existing ellipsometer could be used, a completely new UHV-apparatus including the in-situ phase modulation ellipsometer had to be developed for Ga1 xBix alloys. For the KxKCl1-x system new results on complete wetting at solid-liquid coexistence as well as in the homogenous liquid phase (prewetting) are presented. The spectra show the typical F center absorption which indicates that the film is a salt-rich phase. The thickness strongly increases approaching the monotectic from 30 to 440 nm, which is in agreement with the tetra point wetting scenario. For this interpretation a quantitative description of the excess Gibbs energy has been developed. For the Ga1 xBix system the results on complete wetting, surface freezing and oscillatory interfacial instabilities are presented. The high-precision spectra have been recorded approaching the liquid-liquid miscibility. These spectra have been modeled using a Ga-Bi effective medium approximation for the substrate covered by a film of liquid Bi. The measurements give evidence of tetra point wetting in the Ga-Bi system. First ellipsometric study of the surface freezing in Ga-Bi has been performed. Within the miscibility gap a very interesting effect of surface and bulk oscillatory instability was observed. The details of this process at present are not well understood, but a qualitative description is given.


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A Fortran program for analysis of ellipsometer measurements
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Year: 1969 Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology,

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Spectroscopic ellipsometry of interfacial phase transitions in fluid metallic systems: KxKCl1-x and Ga1-xBix [online]
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Year: 2004 Publisher: KIT Scientific Publishing

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The investigation of the interfacial phase transitions in fluid systems with short-range intermetallic interactions are of great interest. The phenomena were studied in two systems exhibiting a liquid-liquid miscibility gap: at the fluid/wall interface in fluid KxKCl1-x and at the fluid/vacuum interface of the Ga1 xBix alloys. To characterize the interfacial changes of the ultra thin films (composition, thickness and their evolution with time) the spectroscopic ellipsometry was performed over a wide spectral range. Whereas in the experiments on KxKCl1-x an existing ellipsometer could be used, a completely new UHV-apparatus including the in-situ phase modulation ellipsometer had to be developed for Ga1 xBix alloys. For the KxKCl1-x system new results on complete wetting at solid-liquid coexistence as well as in the homogenous liquid phase (prewetting) are presented. The spectra show the typical F center absorption which indicates that the film is a salt-rich phase. The thickness strongly increases approaching the monotectic from 30 to 440 nm, which is in agreement with the tetra point wetting scenario. For this interpretation a quantitative description of the excess Gibbs energy has been developed. For the Ga1 xBix system the results on complete wetting, surface freezing and oscillatory interfacial instabilities are presented. The high-precision spectra have been recorded approaching the liquid-liquid miscibility. These spectra have been modeled using a Ga-Bi effective medium approximation for the substrate covered by a film of liquid Bi. The measurements give evidence of tetra point wetting in the Ga-Bi system. First ellipsometric study of the surface freezing in Ga-Bi has been performed. Within the miscibility gap a very interesting effect of surface and bulk oscillatory instability was observed. The details of this process at present are not well understood, but a qualitative description is given.


Book
Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices : final report, December 2004 - January 2009
Authors: --- --- ---
Year: 2009 Publisher: Golden, Colo. : National Renewable Energy Laboratory,

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Book
Manufacturing process optimization to improve stability, yield, and efficiency of CdS/CdTe PV devices : Phase II, annual technical report, January 2006 - February 2007
Authors: --- --- ---
Year: 2007 Publisher: Golden, Colo. : National Renewable Energy Laboratory,

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