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Accompanying CD-ROM includes ... "a database of useful parameters for SEM and X-ray microanalysis calculations and enhancements to the text chapters."--P. [4] of cover.

620.18 --- 620.18 Investigation of structure of materials. Metallography. Analogous study of non-metals --- Investigation of structure of materials. Metallography. Analogous study of non-metals --- Electron Probe Microanalysis. --- Microscopy, Electron, Scanning. --- Scanning electron microscopy. --- X-ray microanalysis. --- Microscopie électronique à balayage --- Microanalyse aux rayons X --- Science (General). --- X-ray microanalysis --- Scanning electron microscopy --- Monograph --- E-books --- Materials science. --- Microscopy. --- Materials—Surfaces. --- Thin films. --- Nanotechnology. --- Characterization and Evaluation of Materials. --- Materials Science, general. --- Science, Humanities and Social Sciences, multidisciplinary. --- Biological Microscopy. --- Surfaces and Interfaces, Thin Films. --- Molecular technology --- Nanoscale technology --- High technology --- Films, Thin --- Solid film --- Solid state electronics --- Solids --- Surfaces (Technology) --- Coatings --- Thick films --- Analysis, Microscopic --- Light microscopy --- Micrographic analysis --- Microscope and microscopy --- Microscopic analysis --- Optical microscopy --- Optics --- Material science --- Physical sciences